Keysight intros Source Measure Unit for semiconductor characterization

Keysight Technologies introduced a Source Measure Unit (SMU) solution to speed semiconductor characterization.

The new PZ2100 Series High-Channel Density Precision Source Measure Unit (SMU) Solution, simplifies channel stacking and synchronization to remove integration and coding complexity. It offers up to 20 SMU channels in a 1U full-width form factor that does not require cooling spacers when stacked. The solution is available in five SMU module options that are configurable and upgradeable.

Toshio Kimura, General Manager for Furukawa Electric's Next Generation Components Development Department, Next Generation Photonics Business Innovation Project Team, said: "By embedding Keysight's PZ2100 High-Channel Density Precision SMU into our test system, it increases our test throughput for developing and mass-producing optical components for broadband, long-distance transmission.”