Tuesday, August 31, 2010

Agilent Updates Wireless Signal Analyzers

Agilent Technologies
introduced eight new measurement applications for its PXA X-Series wireless signal analyzer and three new measurement applications have for its MXA and EXA signal analyzers. In addition, Agilent's LTE FDD, LTE TDD and EDGE Evolution applications have been updated with the following features:

  • new in-band emissions and spectrum flatness measurements with pre-set limit lines for UE transmitter conformance test;


  • new downlink transport layer decoding for PBCH, PCFICH, PDCCH and PDSCH channels;


  • new conformance EVM measurement optimized for measurement speed for manufacturing throughput; and


  • support for UE specific RS for LTE-TDD.
http://www.agilent.com